SMART: A planned ultrahigh-resolution spectromicroscope for Bessy II

Journal of Electron Spectroscopy and Related Phenomena

Volumn 84, Issue 1-3, 1997, Pages 231-250

  Fink, R ^a   Weiss, M R ^a   Umbach, E ^a   Preikszas, D ^b   Rose, H ^b   Spehr, R ^b   Hartel, P ^b   Engel, W ^c   Degenhardt, R ^c   Wichtendahl, R ^c   Kuhlenbeck, H ^c   Erlebach, W ^c   Ihmann, K ^c   Schlogl R ^c   Freund, H J ^c   Bradshaw, A M ^c   Lilienkamp, G ^d   Schmidt, Th ^d   Bauer, E ^d   Benner, G ^e  

^a UNIVERSITY OF WÜRZBURG   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^d CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

^e LEO Elektronenmikroskopie GmbH   (Germany)

Author keywords

LEEM; Small spot LEED; SMART; Ultrahigh resolution spectromicroscope; XPEEM

Indexed keywords

EID: 0000573107     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00016-9     Document Type: Article

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