Time-of-flight photoelectron emission microscopy TOF-PEEM: First results

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 406, Issue 3, 1998, Pages 499-506

  Spiecker, H ^a   Schmidt, O ^b   Ziethen, Ch ^b   Menke, D ^a   Kleineberg, U ^a   Ahuja, R C ^c   Merkel, M ^d   Heinzmann, U ^a   Schonhense G ^b  

^a BIELEFELD UNIVERSITY   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c LAVISION GMBH   (Germany)

^d FOCUS GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; PERFORMANCE; PHOTOELECTRON SPECTROSCOPY; SYNCHROTRON RADIATION;

PHOTOELECTRON EMISSION MICROSCOPY; TIME OF FLIGHT MODE;

ELECTRON MICROSCOPY;

EID: 0032049341     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(97)01215-1     Document Type: Article

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