Lateral resolving power of a time-of-flight photoemission electron microscope

Applied Physics A: Materials Science and Processing

Volumn 78, Issue 1, 2004, Pages 47-51

  Nepijko, S A ^a,b   Oelsner, A ^a   Krasyuk, A ^a   Gloskovskii, A ^a   Sedov, N N ^c   Schneider, C M ^d   Schonhense G ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b INSTITUTE OF PHYSICS   (Ukraine)

^c Moscow Military Institute   (Russian Federation)

^d IFW DRESDEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; DIAPHRAGMS; ELECTRIC POTENTIAL; ELECTRON MICROSCOPES; LASER PULSES; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS;

EMISSION ELECTRON MICROSCOPY (EEM); PHOTOELECTRONS (PHE);

PHOTOEMISSIVE DEVICES;

EID: 0742303164     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-003-2291-5     Document Type: Article

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