Esca Microscopy at Elettra: What it is like to perform spectromicroscopy experiments on a third generation synchrotron radiation source

Journal of Electron Spectroscopy and Related Phenomena

Volumn 84, Issue 1-3, 1997, Pages 73-83

  Marsi, M ^a   Casalis, L ^a   Gregoratti, L ^a   Gunther S ^a   Kolmakov, A ^a   Kovac, J ^a   Lonza, D ^a   Kiskinova, M ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

Elemental and chemical imaging; Local changing effects; Metal semiconductor interfaces; Synchroton spectromicroscopy; Topographical effects

Indexed keywords

EID: 0003011430     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00010-8     Document Type: Article

References (39)

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2. See, for instance, Soft X-ray microscopy, C. Jacobsen and J. Trebes (Eds.), Proc. SPIE, 1741 (1993); G. Margaritondo, F. Cerrina, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 26; B.P. Tonner, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 60; E. Bauer, Ultramicroscopy, 36 (1991) 52.
3. See, for instance, Soft X-ray microscopy, C. Jacobsen and J. Trebes (Eds.), Proc. SPIE, 1741 (1993); G. Margaritondo, F. Cerrina, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 26; B.P. Tonner, Nucl. Instrum. Methods Phys. Res. Sect. A, 291 (1990) 60; E. Bauer, Ultramicroscopy, 36 (1991) 52.
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17. Fresnel zone plates have been extensively used to focus X-rays. See, for instance, G. Schmahl, D. Rudolph, Optik, 29 (1969) 577; J. Kirz, J. Opt. Soc. Am., 64 (1974) 301; E.H. Anderson, D. Kern, in A.G. Michette, G.R. Morrison and C.J. Buckley (Eds.), X-Ray Microscopy III, Proc. 3rd International Conference on X-Ray Microscopy, London, UK, 3-7 September 1990, Springer-Verlag, Berlin, 1992, p. 75; J. Thieme, C. David, N. Fay, B. Kaulich, R. Medenwaldt, M. Hettwer, P. Guttmann, U. Kögler, J. Maser, G. Schneider, D. Rudolph, G. Schmahl, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 487; P. Charalambous, A. Firsov, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 510; D. Attwood, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 20; E. Di Fabrizio, M. Gentili, L. Grella, M. Baciocchi, A. Krasnosperova, F. Cerrina, W. Yun, B. Lai, E. Gluskin, J. Vac. Sci. Technol. B, 12 (1994) 3979.
18. Fresnel zone plates have been extensively used to focus X- rays. See, for instance, G. Schmahl, D. Rudolph, Optik, 29 (1969) 577; J. Kirz, J. Opt. Soc. Am., 64 (1974) 301; E.H. Anderson, D. Kern, in A.G. Michette, G.R. Morrison and C.J. Buckley (Eds.), X-Ray Microscopy III, Proc. 3rd International Conference on X-Ray Microscopy, London, UK, 3-7 September 1990, Springer-Verlag, Berlin, 1992, p. 75; J. Thieme, C. David, N. Fay, B. Kaulich, R. Medenwaldt, M. Hettwer, P. Guttmann, U. Kögler, J. Maser, G. Schneider, D. Rudolph, G. Schmahl, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 487; P. Charalambous, A. Firsov, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 510; D. Attwood, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 20; E. Di Fabrizio, M. Gentili, L. Grella, M. Baciocchi, A. Krasnosperova, F. Cerrina, W. Yun, B. Lai, E. Gluskin, J. Vac. Sci. Technol. B, 12 (1994) 3979.
19. Fresnel zone plates have been extensively used to focus X- rays. See, for instance, G. Schmahl, D. Rudolph, Optik, 29 (1969) 577; J. Kirz, J. Opt. Soc. Am., 64 (1974) 301; E.H. Anderson, D. Kern, in A.G. Michette, G.R. Morrison and C.J. Buckley (Eds.), X-Ray Microscopy III, Proc. 3rd International Conference on X-Ray Microscopy, London, UK, 3-7 September 1990, Springer-Verlag, Berlin, 1992, p. 75; J. Thieme, C. David, N. Fay, B. Kaulich, R. Medenwaldt, M. Hettwer, P. Guttmann, U. Kögler, J. Maser, G. Schneider, D. Rudolph, G. Schmahl, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 487; P. Charalambous, A. Firsov, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 510; D. Attwood, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 20; E. Di Fabrizio, M. Gentili, L. Grella, M. Baciocchi, A. Krasnosperova, F. Cerrina, W. Yun, B. Lai, E. Gluskin, J. Vac. Sci. Technol. B, 12 (1994) 3979.
20. Fresnel zone plates have been extensively used to focus X- rays. See, for instance, G. Schmahl, D. Rudolph, Optik, 29 (1969) 577; J. Kirz, J. Opt. Soc. Am., 64 (1974) 301; E.H. Anderson, D. Kern, in A.G. Michette, G.R. Morrison and C.J. Buckley (Eds.), X-Ray Microscopy III, Proc. 3rd International Conference on X-Ray Microscopy, London, UK, 3-7 September 1990, Springer-Verlag, Berlin, 1992, p. 75; J. Thieme, C. David, N. Fay, B. Kaulich, R. Medenwaldt, M. Hettwer, P. Guttmann, U. Kögler, J. Maser, G. Schneider, D. Rudolph, G. Schmahl, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 487; P. Charalambous, A. Firsov, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 510; D. Attwood, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 20; E. Di Fabrizio, M. Gentili, L. Grella, M. Baciocchi, A. Krasnosperova, F. Cerrina, W. Yun, B. Lai, E. Gluskin, J. Vac. Sci. Technol. B, 12 (1994) 3979.
21. Fresnel zone plates have been extensively used to focus X- rays. See, for instance, G. Schmahl, D. Rudolph, Optik, 29 (1969) 577; J. Kirz, J. Opt. Soc. Am., 64 (1974) 301; E.H. Anderson, D. Kern, in A.G. Michette, G.R. Morrison and C.J. Buckley (Eds.), X-Ray Microscopy III, Proc. 3rd International Conference on X-Ray Microscopy, London, UK, 3-7 September 1990, Springer-Verlag, Berlin, 1992, p. 75; J. Thieme, C. David, N. Fay, B. Kaulich, R. Medenwaldt, M. Hettwer, P. Guttmann, U. Kögler, J. Maser, G. Schneider, D. Rudolph, G. Schmahl, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 487; P. Charalambous, A. Firsov, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 510; D. Attwood, in V.V. Aristov and A.I. Erko (Eds.), X-ray Microscopy IV, Proc. 4th International Conference on X-ray Microscopy, Chernogolovka, Russia, 20-24 September 1993, Bogorodskii Pechatnik Publishing Co., 1994, p. 20; E. Di Fabrizio, M. Gentili, L. Grella, M. Baciocchi, A. Krasnosperova, F. Cerrina, W. Yun, B. Lai, E. Gluskin, J. Vac. Sci. Technol. B, 12 (1994) 3979.
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