Force microscopy with light-atom probes

Science

Volumn 305, Issue 5682, 2004, Pages 380-383

  Hembacher, Stefan ^a   Giessibl, Franz J ^a   Mannhart, Jochen ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BONDING; ELECTRIC CHARGE; ELECTRONS; GRAPHITE; TUNGSTEN;

CHARGE DENSITY; CHARGE DISTRIBUTIONS; CONALENT BONDING; ELECTRON SHELLS;

ATOMIC FORCE MICROSCOPY;

TUNGSTEN;

MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; ATOMIC PARTICLE; COVALENT BOND; DENSITY; ELECTRICITY; MEASUREMENT; MOLECULAR INTERACTION; MOLECULAR PROBE; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 3142683686     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1099730     Document Type: Article

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