Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

Surface Science

Volumn 480, Issue 3, 2001, Pages 196-202

  Merkel, M ^a   Escher, M ^a   Settemeyer, J ^a   Funnemann, D ^b   Oelsner, A ^c   Ziethen, Ch ^c   Schmidt, O ^c   Klais, M ^c   Schonhense G ^c  

^a FOCUS GmbH   (Germany)

^b Omicron Vakuumphysik GmbH   (Germany)

^c JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

Electron microscopy; Photoelectron spectroscopy

Indexed keywords

ELECTRON MICROSCOPY; OPTICAL FILTERS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SYNCHROTRONS;

MICROSPECTROSCOPY; RETARDING FIELD ANALYZER (RFA);

SURFACE CHEMISTRY;

EID: 0035366083     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)00835-4     Document Type: Article

References (6)

1. Spectromicroscopy