SCOPUS 정보 검색 플랫폼

Diamond and Related Materials

Volumn 11, Issue 3-6, 2002, Pages 1068-1073

Soft X-ray photoelectron microscopy used for the characterization of diamond, a-C and CNx, thin films

(6) Ziethen, Ch a Wegelin, F a Schonhense G a Ohr, R b Neuhauser M b Hilgers, H b

a JOHANNES GUTENBERG UNIVERSITY (Germany)

b IBM (Germany)

Author keywords

a C; CNx; Coating; Diamond; Electron microscopy; Electron spectroscopy; Microstructure

Indexed keywords

AMORPHOUS FILMS; CARBON NITRIDE; CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; DIAMOND LIKE CARBON FILMS; ELECTRON MICROSCOPY; THIN FILMS; X RAY ANALYSIS;

ELECTRON MICROGRAPHS;

DIAMOND FILMS;

STRUCTURAL ANALYSIS;

EID: 0036508492 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(01)00597-0 Document Type: Article

Times cited : (15)

References (17)

1
- 0009588355
- Ed
- (1997) J. Electron Spectr. Relat. Phenom , vol.84
- Ade, H.¹

2
- 4244127144
- Eds
- (2001) Surf. Sci , vol.48
- Bauer, E.¹ Ernst, H.-J.² Douillard, L.³

3
- 11244262085
- Ch. Ziethen et al., to be published
- (1998) J. Elec. Spec. Rel. Phen , vol.88-91 , pp. 983
- Ziethen, Ch.¹ Schmidt, O.² Fecher, G.H.³

4
- 0000219372
- (1999) Appl. Phys. Lett , vol.75 , pp. 1099
- Wienss, A.¹ Persch-Schuy, G.² Vogelsang, M.³ Hartmann, U.⁴

5
- 0032292360
- (1998) Mat. Res. Soc. Symp. Proc , vol.517 , pp. 415
- Anders, S.¹ Stammler, Th.² Singh Bhatia, C.³ Stöhr, J.⁴ Fong, W.⁵ Chen, C.-Y.⁶ Bogy, D.B.⁷

6
- 0000879286
- (1993) Phys. Rev. B , vol.48 , pp. 4777
- Fallon, P.J.¹ Veerasamy, V.S.² Davis, C.A.³

7
- 0034207512
- (2000) J. Electron. Spectr. Relat. Phenom , vol.107 , pp. 261
- Ziethen, Ch.¹ Schmidt, O.² Marx, G.K.L.³

8
- 0002560241
- H.A. Calderon Benavides, M. Jose Yacaman (Eds.), Int. Congr. Elec. Mic. (Cancun), 1, Institute of Physics Publ. Bristol
- (1998) Electron Microscopy , vol.1 F , pp. 215
- Grogger, P.¹ Warbichler, F.² Hofer, Th.³ Lang, Th.⁴ Schintlmeister, W.⁵

9
- 0242603790
- (2000) Phys. Rev. B , vol.61 , pp. 14095
- Ferrari, A.C.¹ Robertson, J.²

10
- 0001060792
- (1999) Phys. Rev. B , vol.60
- Ripalda, J.M.¹ Román, E.² Díaz, N.³

11
- 0034261161
- (2000) Phys. Rev. B , vol.52
- Shimoyama, I.¹ Wu, G.² Sekiguchi, T.³ Baba, Y.⁴

12
- 4344607598
- (2001) J. Electron Spectr. Relat. Phenom , vol.114-116 , pp. 841
- Shimoyama, I.¹ Wu, G.² Sekiguchi, T.³ Baba, Y.⁴

13
- 18944368098
- (1999) Phys. Stat. Sol. (a) , vol.174 , pp. 25
- Rodil, S.E.¹ Morrison, N.A.² Robertson, J.³ Milne, W.I.⁴

14
- 0000364612
- (1998) Phys. Rev. B , vol.57
- Hu, J.¹ Yang, P.² Lieber, C.M.³

15
- 0041710593
- (2000) Thin Solid Films , vol.366 , pp. 69
- Jelínek, M.¹ Zemek, J.² Trchová, M.³

16
- 0034315659
- (2000) Thin Solid Films , vol.376 , pp. 152
- Hayashi, T.¹ Matsumuro, A.² Muramatsu, M.³ Kohzaki, M.⁴ Yamaguchi, K.⁵

17
- 0034140267
- (2000) Thin Solid Films , vol.360 , pp. 173
- Tomcik, B.¹ Osipowicz, T.² Lee, J.Y.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.