A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

Review of Scientific Instruments

Volumn 69, Issue 8, 1998, Pages 2964-2973

  Warwick, T ^a   Franck, K ^a   Kortright, J B ^a   Meigs, G ^a   Moronne, M ^a   Myneni, S ^a   Rotenberg, E ^a   Seal, S ^a   Steele, W F ^a   Ade, H ^b   Garcia, A ^b   Cerasari, S ^c   Denlinger, J ^d   Hayakawa, S ^e   Hitchcock, A P ^f   Tyliszczak, T ^f   Kikuma, J ^g   Rightor, E G ^h   Shin, H J ⁱ   Tonner, B P ^j  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF TRIESTE   (Italy)

^d UNIVERSITY OF MICHIGAN   (United States)

^e UNIVERSITY OF TOKYO   (Japan)

^f MCMASTER UNIVERSITY   (Canada)

^g ASAHI CHEMICAL INDUSTRY CO   (Japan)

^h DOW CHEMICAL COMPANY   (United States)

ⁱ POSTECH   (South Korea)

^j UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CARBON; ELECTRON ENERGY LOSS SPECTROSCOPY; INTERFACES (MATERIALS); MAGNETIC THIN FILMS; MATERIALS SCIENCE; NITROGEN; OXYGEN; PHOTONS; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

ADVANCE LIGHT SOURCE; SCANNING TRANSMISSION X RAY MICROSCOPE; X RAY POLYMER SPECTROMICROSCOPIC ANALYSIS;

X RAY MICROSCOPES;

EID: 0032132429     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149041     Document Type: Article

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