NanoESCA: Imaging UPS and XPS with high energy resolution

Journal of Electron Spectroscopy and Related Phenomena

Volumn 144-147, Issue , 2005, Pages 1179-1182

  Escher, M ^a   Weber, N ^a   Merkel, M ^a   Kromker B ^b   Funnemann, D ^b   Schmidt, S ^c   Reinert, F ^e   Forster, F ^e   Hufner S ^c   Bernhard, P ^d   Ziethen, Ch ^d   Elmers, H J ^d   Schonhense G ^d  

^a Focus GmbH   (Germany)

^b Omicron Nanotechnology GmbH   (Germany)

^c SAARLAND UNIVERSITY   (Germany)

^d JOHANNES GUTENBERG UNIVERSITY   (Germany)

^e UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

Imaging XPS; Photoemission spectromicroscopy

Indexed keywords

DISPERSIONS; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOEMISSION SPECTROMICROSCOPY; SPATIAL RESOLUTION; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS);

IMAGING TECHNIQUES;

EID: 20244369269     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.250     Document Type: Conference Paper

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