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Volumn 46, Issue 7, 2002, Pages 951-958

Current status and future directions of SOI technology

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC INSULATORS; MOSFET DEVICES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES; VLSI CIRCUITS;

EID: 0036642925     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00030-8     Document Type: Conference Paper
Times cited : (11)

References (66)
  • 59
    • 0001747516 scopus 로고    scopus 로고
    • Optimized design of the subband structure in MOS inversion layers for realizing high performance and low power Si MOSFETs
    • (2000) Int J High Speed Electron Syst , vol.10 , Issue.1 , pp. 155-170
    • Takagi, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.