Soft error considerations for deep-submicron CMOS circuit applications

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1999, Pages 315-318

  Cohen, Neil ^a   Sriram, T S ^a   Leland, Norm ^a   Moyer, David ^a   Butler, Steve ^a   Flatley, Robert ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; COMPUTER SIMULATION; ELECTRIC POWER SUPPLIES TO APPARATUS; ERRORS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE;

CMOS TECHNOLOGY SCALING; SOFT ERROR FAILURE IN TIME RATES; STATIC RANDOM ACCESS MEMORY;

CMOS INTEGRATED CIRCUITS;

EID: 0033314263     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)