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Volumn 117, Issue 20, 2013, Pages 10492-10501

Image calculations with a numerical frequency-modulation atomic force microscope

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; ATOMIC FORCE MICROSCOPE (AFM); IMAGE CALCULATIONS; LARGE AMPLITUDE; MOLECULAR SYSTEMS; NUMERICAL TOOLS; PLANAR MOLECULES; SUB-MOLECULAR RESOLUTION;

EID: 84878136092     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp400948a     Document Type: Article
Times cited : (9)

References (102)
  • 1
    • 69549111335 scopus 로고    scopus 로고
    • The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy
    • Gross, L.; Mohn, F.; Moll, N.; Liljeroth, P.; Meyer, G. The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy Science 2009, 325, 1110-1114
    • (2009) Science , vol.325 , pp. 1110-1114
    • Gross, L.1    Mohn, F.2    Moll, N.3    Liljeroth, P.4    Meyer, G.5
  • 2
    • 77957261630 scopus 로고    scopus 로고
    • Organic Structure Determination Using Atomic-Resolution Scanning Probe Microscopy
    • Gross, L.; Mohn, F.; Moll, N.; Meyer, G.; Ebel, R.; Abdel-Mageed, W. M.; Jaspars, M. Organic Structure Determination Using Atomic-Resolution Scanning Probe Microscopy Nat. Chem. 2010, 2, 821-825
    • (2010) Nat. Chem. , vol.2 , pp. 821-825
    • Gross, L.1    Mohn, F.2    Moll, N.3    Meyer, G.4    Ebel, R.5    Abdel-Mageed, W.M.6    Jaspars, M.7
  • 3
    • 79953103573 scopus 로고    scopus 로고
    • Recent Advances in Submolecular Resolution with Scanning Probe Microscopy
    • Gross, L. Recent Advances in Submolecular Resolution with Scanning Probe Microscopy Nat. Chem. 2011, 3, 273-278
    • (2011) Nat. Chem. , vol.3 , pp. 273-278
    • Gross, L.1
  • 4
    • 84857592954 scopus 로고    scopus 로고
    • Atomic Force Microscopy Reveals Bistable Configurations of Dibenzo[ a, h ]thianthrene and their Interconversion Pathway
    • Pavliček, N.; Fleury, B.; Neu, M.; Niedenführ, J.; Herranz-Lancho, C.; Ruben, M.; Repp, J. Atomic Force Microscopy Reveals Bistable Configurations of Dibenzo[ a, h ]thianthrene and their Interconversion Pathway Phys. Rev. Lett. 2012, 108, 086101
    • (2012) Phys. Rev. Lett. , vol.108 , pp. 086101
    • Pavliček, N.1    Fleury, B.2    Neu, M.3    Niedenführ, J.4    Herranz-Lancho, C.5    Ruben, M.6    Repp, J.7
  • 5
    • 84859622351 scopus 로고    scopus 로고
    • Imaging the Charge Distribution Within a Single Molecule
    • Mohn, F.; Gross, L.; Moll, N.; Meyer, G. Imaging the Charge Distribution Within a Single Molecule Nat. Nanotechnol. 2012, 7, 227-231
    • (2012) Nat. Nanotechnol. , vol.7 , pp. 227-231
    • Mohn, F.1    Gross, L.2    Moll, N.3    Meyer, G.4
  • 6
    • 84860195217 scopus 로고    scopus 로고
    • Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy
    • Welker, J.; Giessibl, F. J. Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy Science 2012, 336, 444-449
    • (2012) Science , vol.336 , pp. 444-449
    • Welker, J.1    Giessibl, F.J.2
  • 8
    • 79251512950 scopus 로고    scopus 로고
    • Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods
    • Barth, C.; Foster, A. S.; Henry, C. R.; Shluger, A. L. Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods Adv. Mater. 2011, 23, 477-501
    • (2011) Adv. Mater. , vol.23 , pp. 477-501
    • Barth, C.1    Foster, A.S.2    Henry, C.R.3    Shluger, A.L.4
  • 9
  • 12
    • 79954554222 scopus 로고    scopus 로고
    • Charge State Control of Molecules Reveals Modification of the Tunneling Barrier with Intramolecular Contrast
    • Swart, I.; Sonnleitner, T.; Repp, J. Charge State Control of Molecules Reveals Modification of the Tunneling Barrier with Intramolecular Contrast Nano Lett. 2011, 11, 1580-1584
    • (2011) Nano Lett. , vol.11 , pp. 1580-1584
    • Swart, I.1    Sonnleitner, T.2    Repp, J.3
  • 16
    • 65149094744 scopus 로고    scopus 로고
    • STM Images of a Large Organic Molecule Adsorbed on a Bare Metal Substrate or on a Thin Insulating Layer: Visualization of HOMO and LUMO
    • Villagomez, C. J.; Zambelli, T.; Gauthier, S.; Gourdon, A.; Stojkovic, S.; Joachim, C. STM Images of a Large Organic Molecule Adsorbed on a Bare Metal Substrate or on a Thin Insulating Layer: Visualization of HOMO and LUMO Surf. Sci. 2009, 603, 1526-1532
    • (2009) Surf. Sci. , vol.603 , pp. 1526-1532
    • Villagomez, C.J.1    Zambelli, T.2    Gauthier, S.3    Gourdon, A.4    Stojkovic, S.5    Joachim, C.6
  • 17
    • 18144386607 scopus 로고    scopus 로고
    • Molecules on Insulating Films: Scanning-Tunneling Microscopy Imaging of Individual Molecular Orbitals
    • Repp, J.; Meyer, G.; Stojković, S. M.; Gourdon, A.; Joachim, C. Molecules on Insulating Films: Scanning-Tunneling Microscopy Imaging of Individual Molecular Orbitals Phys. Rev. Lett. 2005, 94, 026803
    • (2005) Phys. Rev. Lett. , vol.94 , pp. 026803
    • Repp, J.1    Meyer, G.2    Stojković, S.M.3    Gourdon, A.4    Joachim, C.5
  • 18
    • 67649366119 scopus 로고    scopus 로고
    • Structure andStability of Semiconductor Tip Apexes for Atomic Force Microscopy
    • Pou, P.; Ghasemi, S. A.; Jelinek, P.; Lenosky, T.; Goedecker, S.; Perez, R. Structure andStability of Semiconductor Tip Apexes for Atomic Force Microscopy Nanotechnology 2009, 20, 264015
    • (2009) Nanotechnology , vol.20 , pp. 264015
    • Pou, P.1    Ghasemi, S.A.2    Jelinek, P.3    Lenosky, T.4    Goedecker, S.5    Perez, R.6
  • 20
    • 0026880950 scopus 로고
    • Interpretation of STM Images: Copper-Phthalocyanine on Copper
    • Sautet, P.; Joachim, C. Interpretation of STM Images: Copper-Phthalocyanine on Copper Surf. Sci. 1992, 271, 387-394
    • (1992) Surf. Sci. , vol.271 , pp. 387-394
    • Sautet, P.1    Joachim, C.2
  • 22
    • 0347653361 scopus 로고    scopus 로고
    • Theories of Scanning Probe Microscopes at the Atomic Scale
    • Hofer, W. A.; Foster, A. S.; Shluger, A. L. Theories of Scanning Probe Microscopes at the Atomic Scale Rev. Mod. Phys. 2003, 75, 1287-1331
    • (2003) Rev. Mod. Phys. , vol.75 , pp. 1287-1331
    • Hofer, W.A.1    Foster, A.S.2    Shluger, A.L.3
  • 24
    • 84857788735 scopus 로고    scopus 로고
    • Nt-STM: A Step Forward in Scanning Tunneling Microscopy (STM) Simulations
    • Magoga, M.; Archambault, F.; Cerdá, J. I. Nt-STM: A Step Forward in Scanning Tunneling Microscopy (STM) Simulations Comput. Phys. Commun. 2012, 183, 1246-1249
    • (2012) Comput. Phys. Commun. , vol.183 , pp. 1246-1249
    • Magoga, M.1    Archambault, F.2    Cerdá, J.I.3
  • 25
    • 0035421779 scopus 로고    scopus 로고
    • A Virtual Non Contact-Atomic Force Microscope (NC-AFM): Simulation and Comparison with Analytical Models
    • Couturier, G.; Aimé, J. P.; Salardenne, J.; Boisgard, R. A Virtual Non Contact-Atomic Force Microscope (NC-AFM): Simulation and Comparison With Analytical Models Eur. Phys. J.: Appl. Phys. 2001, 15, 141-147
    • (2001) Eur. Phys. J.: Appl. Phys. , vol.15 , pp. 141-147
    • Couturier, G.1    Aimé, J.P.2    Salardenne, J.3    Boisgard, R.4
  • 27
    • 13744251846 scopus 로고    scopus 로고
    • A Virtual Dynamic Atomic Force Microscope for Image Calculations
    • Polesel-Maris, J.; Gauthier, S. A Virtual Dynamic Atomic Force Microscope for Image Calculations J. Appl. Phys. 2005, 97, 044902
    • (2005) J. Appl. Phys. , vol.97 , pp. 044902
    • Polesel-Maris, J.1    Gauthier, S.2
  • 28
    • 33846280095 scopus 로고    scopus 로고
    • Noncontact Atomic Force Microscopy Simulator with Phase-Locked-Loop Controlled Frequency Detection and Excitation
    • Nony, L.; Baratoff, A.; Schär, D.; Pfeiffer, O.; Wetzel, A.; Meyer, E. Noncontact Atomic Force Microscopy Simulator with Phase-Locked-Loop Controlled Frequency Detection and Excitation Phys. Rev. B 2006, 74, 235439
    • (2006) Phys. Rev. B , vol.74 , pp. 235439
    • Nony, L.1    Baratoff, A.2    Schär, D.3    Pfeiffer, O.4    Wetzel, A.5    Meyer, E.6
  • 29
    • 33846354601 scopus 로고    scopus 로고
    • Controlled Manipulation of Atoms in Insulating Surfaces with the Virtual Atomic Force Microscope
    • Trevethan, T.; Watkins, M.; Kantorovich, L.; Shluger, A. Controlled Manipulation of Atoms in Insulating Surfaces with the Virtual Atomic Force Microscope Phys. Rev. Lett. 2007, 98, 028101
    • (2007) Phys. Rev. Lett. , vol.98 , pp. 028101
    • Trevethan, T.1    Watkins, M.2    Kantorovich, L.3    Shluger, A.4
  • 30
    • 84857298566 scopus 로고    scopus 로고
    • Gaining Insight into the Physics of Dynamic Atomic Force Microscopy in Complex Environments Using the VEDA Simulator
    • Kiracofe, D.; Melcher, J.; Raman, A. Gaining Insight into the Physics of Dynamic Atomic Force Microscopy in Complex Environments Using the VEDA Simulator Rev. Sci. Instrum. 2012, 83, 013702
    • (2012) Rev. Sci. Instrum. , vol.83 , pp. 013702
    • Kiracofe, D.1    Melcher, J.2    Raman, A.3
  • 32
    • 0032026111 scopus 로고    scopus 로고
    • Scanning Force Microscopy Simulations of Well-Characterized Nanostructures on Dielectric and Semiconducting Substrates
    • Touhari, F.; Bouju, X.; C., G.; Devel, M.; Cohen-Solal, G. Scanning Force Microscopy Simulations of Well-Characterized Nanostructures on Dielectric and Semiconducting Substrates Appl. Surf. Sci. 1998, 125, 351-359
    • (1998) Appl. Surf. Sci. , vol.125 , pp. 351-359
    • Touhari, F.1    Bouju, X.2    Gu, C.3    Devel, M.4    Cohen-Solal, G.5
  • 33
    • 82655169651 scopus 로고    scopus 로고
    • Influence of Tip Structure on Tip-Sample Interaction Forces at the KBr(001) Surface: Results from ab initio Investigations
    • Wieferink, C.; Krüger, P.; Pollmann, J. Influence of Tip Structure on Tip-Sample Interaction Forces at the KBr(001) Surface: Results From ab initio Investigations Phys. Rev. B 2011, 84, 195402
    • (2011) Phys. Rev. B , vol.84 , pp. 195402
    • Wieferink, C.1    Krüger, P.2    Pollmann, J.3
  • 34
    • 0035848210 scopus 로고    scopus 로고
    • Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator
    • Foster, A. S.; Barth, C.; Shluger, A. L.; Reichling, M. Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator Phys. Rev. Lett. 2001, 86, 2373-2376
    • (2001) Phys. Rev. Lett. , vol.86 , pp. 2373-2376
    • Foster, A.S.1    Barth, C.2    Shluger, A.L.3    Reichling, M.4
  • 35
    • 79251574155 scopus 로고    scopus 로고
    • The Role of the Tip in Non-Contact Atomic Force Microscopy Dissipation Images of Ionic Surfaces
    • Canova, F. F.; Foster, A. S. The Role of the Tip in Non-Contact Atomic Force Microscopy Dissipation Images of Ionic Surfaces Nanotechnology 2011, 22, 045702
    • (2011) Nanotechnology , vol.22 , pp. 045702
    • Canova, F.F.1    Foster, A.S.2
  • 36
    • 42749104902 scopus 로고    scopus 로고
    • General Theory of Microscopic Dynamical Response in Surface Probe Microscopy: From Imaging to Dissipation
    • Kantorovich, L. N.; Trevethan, T. General Theory of Microscopic Dynamical Response in Surface Probe Microscopy: From Imaging to Dissipation Phys. Rev. Lett. 2004, 93, 236102
    • (2004) Phys. Rev. Lett. , vol.93 , pp. 236102
    • Kantorovich, L.N.1    Trevethan, T.2
  • 37
    • 34548027980 scopus 로고    scopus 로고
    • Multiscale Model of the Manipulation of Single Atoms on Insulating Surfaces Using an Atomic Force Microscope Tip
    • Trevethan, T.; Kantorovich, L.; Polesel-Maris, J.; Gauthier, S.; Shluger, A. Multiscale Model of the Manipulation of Single Atoms on Insulating Surfaces Using an Atomic Force Microscope Tip Phys. Rev. B 2007, 76, 085414
    • (2007) Phys. Rev. B , vol.76 , pp. 085414
    • Trevethan, T.1    Kantorovich, L.2    Polesel-Maris, J.3    Gauthier, S.4    Shluger, A.5
  • 38
    • 45849155353 scopus 로고    scopus 로고
    • Interplay between Nonlinearity, Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy
    • Gauthier, M.; Pérez, R.; Arai, T.; Tomitori, M.; Tsukada, M. Interplay Between Nonlinearity, Scan Speed, Damping, and Electronics in Frequency Modulation Atomic-Force Microscopy Phys. Rev. Lett. 2002, 89, 146104
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 146104
    • Gauthier, M.1    Pérez, R.2    Arai, T.3    Tomitori, M.4    Tsukada, M.5
  • 39
    • 0038188752 scopus 로고    scopus 로고
    • Noncontact Atomic Force Microscopy: Stability Criterion and Dynamical Responses of the Shift of Frequency and Damping Signal
    • Couturier, G.; Boisgard, R.; Nony, L.; Aimé, J. P. Noncontact Atomic Force Microscopy: Stability Criterion and Dynamical Responses of the Shift of Frequency and Damping Signal Rev. Sci. Instrum. 2003, 74, 2726-2734
    • (2003) Rev. Sci. Instrum. , vol.74 , pp. 2726-2734
    • Couturier, G.1    Boisgard, R.2    Nony, L.3    Aimé, J.P.4
  • 40
    • 21144451034 scopus 로고    scopus 로고
    • Damping and Instability in Non-Contact Atomic Force Microscopy: The Contribution of the Instrument
    • Couturier, G.; Boisgard, R.; Dietzel, D.; Aimé, J. P. Damping and Instability in Non-Contact Atomic Force Microscopy: The Contribution of the Instrument Nanotechnology 2005, 16, 1346-1353
    • (2005) Nanotechnology , vol.16 , pp. 1346-1353
    • Couturier, G.1    Boisgard, R.2    Dietzel, D.3    Aimé, J.P.4
  • 41
    • 33644989863 scopus 로고    scopus 로고
    • Novel Amplitude and Frequency Demodulation Algorithm for a Virtual Dynamic Atomic Force Microscope
    • Kokavecz, J.; Tóth, Z.; Horváth, Z. L.; Heszler, P.; Mechler, A. Novel Amplitude and Frequency Demodulation Algorithm for a Virtual Dynamic Atomic Force Microscope Nanotechnology 2006, 17, S173-S177
    • (2006) Nanotechnology , vol.17
    • Kokavecz, J.1    Tóth, Z.2    Horváth, Z.L.3    Heszler, P.4    Mechler, A.5
  • 43
    • 0038981463 scopus 로고
    • Frequency Modulation Detection Using High-Q Cantilevers for Enhanced Force Microscope Sensitivity
    • Albrecht, T. R.; Grutter, P.; Horne, D.; Rugar, D. Frequency Modulation Detection Using High-Q Cantilevers for Enhanced Force Microscope Sensitivity J. Appl. Phys. 1991, 69, 668-673
    • (1991) J. Appl. Phys. , vol.69 , pp. 668-673
    • Albrecht, T.R.1    Grutter, P.2    Horne, D.3    Rugar, D.4
  • 44
  • 45
    • 0000428132 scopus 로고    scopus 로고
    • Forces and Frequency Shifts in Atomic-Resolution Dynamic-Force Microscopy
    • Giessibl, F. Forces and Frequency Shifts in Atomic-Resolution Dynamic-Force Microscopy Phys. Rev. B 1997, 56, 16010-16015
    • (1997) Phys. Rev. B , vol.56 , pp. 16010-16015
    • Giessibl, F.1
  • 46
    • 0038826836 scopus 로고    scopus 로고
    • Conservative and Dissipative Interactions in Dynamic Force Microscopy
    • Dürig, U. Conservative and Dissipative Interactions in Dynamic Force Microscopy Surf. Interface Anal. 1999, 27, 467-473
    • (1999) Surf. Interface Anal. , vol.27 , pp. 467-473
    • Dürig, U.1
  • 47
    • 0343449710 scopus 로고    scopus 로고
    • Nonlinear Dynamical Properties of an Oscillating Tip-Cantilever System in the Tapping Mode
    • Nony, L.; Boisgard, R.; Aimé, J. P. Nonlinear Dynamical Properties of an Oscillating Tip-Cantilever System in the Tapping Mode J. Chem. Phys. 1999, 111, 1615-1627
    • (1999) J. Chem. Phys. , vol.111 , pp. 1615-1627
    • Nony, L.1    Boisgard, R.2    Aimé, J.P.3
  • 48
    • 0000400209 scopus 로고    scopus 로고
    • Physical Interpretation of Frequency-Modulation Atomic Force Microscopy
    • Giessibl, F. J.; Bielefeldt, H. Physical Interpretation of Frequency-Modulation Atomic Force Microscopy Phys. Rev. B 2000, 61, 9968-9971
    • (2000) Phys. Rev. B , vol.61 , pp. 9968-9971
    • Giessibl, F.J.1    Bielefeldt, H.2
  • 49
    • 0033899628 scopus 로고    scopus 로고
    • Role of Image Forces in Non-Contact Scanning Force Microscope Images of Ionic Surfaces
    • Kantorovich, L. N.; Foster, A. S.; Shluger, A. L.; Stoneham, A. M. Role of Image Forces in Non-Contact Scanning Force Microscope Images of Ionic Surfaces Surf. Sci. 2000, 445, 283-299
    • (2000) Surf. Sci. , vol.445 , pp. 283-299
    • Kantorovich, L.N.1    Foster, A.S.2    Shluger, A.L.3    Stoneham, A.M.4
  • 50
    • 68649095215 scopus 로고    scopus 로고
    • Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy
    • Nony, L.; Foster, A. S.; Bocquet, F.; Loppacher, C. Understanding the Atomic-Scale Contrast in Kelvin Probe Force Microscopy Phys. Rev. Lett. 2009, 103, 036802
    • (2009) Phys. Rev. Lett. , vol.103 , pp. 036802
    • Nony, L.1    Foster, A.S.2    Bocquet, F.3    Loppacher, C.4
  • 51
    • 84861356863 scopus 로고    scopus 로고
    • Graphite, Graphene on SiC, and Graphene Nanoribbons: Calculated Images with a Numerical FM-AFM
    • Castanié, F.; Nony, L.; Gauthier, S.; Bouju, X. Graphite, Graphene on SiC, and Graphene Nanoribbons: Calculated Images with a Numerical FM-AFM Beilstein J. Nanotechnol. 2012, 3, 301-311
    • (2012) Beilstein J. Nanotechnol. , vol.3 , pp. 301-311
    • Castanié, F.1    Nony, L.2    Gauthier, S.3    Bouju, X.4
  • 52
    • 78651282174 scopus 로고    scopus 로고
    • The Mechanisms Underlying the Enhanced Resolution of Atomic Force Microscopy with Functionalized Tips
    • Moll, N.; Gross, L.; Mohn, F.; Curioni, A.; Meyer, G. The Mechanisms Underlying the Enhanced Resolution of Atomic Force Microscopy With Functionalized Tips New J. Phys. 2010, 12, 125020
    • (2010) New J. Phys. , vol.12 , pp. 125020
    • Moll, N.1    Gross, L.2    Mohn, F.3    Curioni, A.4    Meyer, G.5
  • 53
    • 84865795074 scopus 로고    scopus 로고
    • A Simple Model of Molecular Imaging with Noncontact Atomic Force Microscopy
    • Moll, N.; Gross, L.; Mohn, F.; Curioni, A.; Meyer, G. A Simple Model of Molecular Imaging With Noncontact Atomic Force Microscopy New J. Phys. 2012, 14, 083023
    • (2012) New J. Phys. , vol.14 , pp. 083023
    • Moll, N.1    Gross, L.2    Mohn, F.3    Curioni, A.4    Meyer, G.5
  • 54
    • 0001641601 scopus 로고    scopus 로고
    • Atomic Resolution on Si(111)-(7 × 7) by Noncontact Atomic Force Microscopy with a Force Sensor Based on a Quartz Tuning Fork
    • Giessibl, F. J. Atomic Resolution on Si(111)-(7 × 7) by Noncontact Atomic Force Microscopy with a Force Sensor Based on a Quartz Tuning Fork Appl. Phys. Lett. 2000, 76, 1470-1473
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 1470-1473
    • Giessibl, F.J.1
  • 56
    • 84866165493 scopus 로고    scopus 로고
    • Probing Three-Dimensional Surface Force Fields with Atomic Resolution: Measurement Strategies, Limitations, and Artifact Reduction
    • Baykara, M. Z.; Dagdeviren, O. E.; Schwendemann, T. C.; Mönig, H.; Altman, E. I.; Schwarz, U. D. Probing Three-Dimensional Surface Force Fields With Atomic Resolution: Measurement Strategies, Limitations, and Artifact Reduction Beilstein J. Nanotechnol. 2012, 3, 637-650
    • (2012) Beilstein J. Nanotechnol. , vol.3 , pp. 637-650
    • Baykara, M.Z.1    Dagdeviren, O.E.2    Schwendemann, T.C.3    Mönig, H.4    Altman, E.I.5    Schwarz, U.D.6
  • 57
    • 0031698096 scopus 로고    scopus 로고
    • Theoretical Study of the Atomic-Force-Microscopy Imaging Process on the NaCl(001) Surface
    • Tang, H.; Bouju, X.; Joachim, C.; Girard, C.; Devillers, J. Theoretical Study of the Atomic-Force-Microscopy Imaging Process on the NaCl(001) Surface J. Chem. Phys. 1998, 108, 359-367
    • (1998) J. Chem. Phys. , vol.108 , pp. 359-367
    • Tang, H.1    Bouju, X.2    Joachim, C.3    Girard, C.4    Devillers, J.5
  • 58
    • 5244299085 scopus 로고    scopus 로고
    • An Improved Force Field (MM4) for Saturated Hydrocarbons
    • Allinger, N. L.; Chen, K.; Lii, J. An Improved Force Field (MM4) for Saturated Hydrocarbons J. Comput. Chem. 1996, 17, 642-668
    • (1996) J. Comput. Chem. , vol.17 , pp. 642-668
    • Allinger, N.L.1    Chen, K.2    Lii, J.3
  • 59
    • 79956204639 scopus 로고    scopus 로고
    • Understanding Molecular Structure from Molecular Mechanics
    • Allinger, N. L. Understanding Molecular Structure from Molecular Mechanics J. Comput.-Aided Mol. Des. 2011, 25, 295-316
    • (2011) J. Comput.-Aided Mol. Des. , vol.25 , pp. 295-316
    • Allinger, N.L.1
  • 61
    • 80053899900 scopus 로고    scopus 로고
    • Comparison of Force Sensors for Atomic Force Microscopy Based on Quartz Tuning Forks and Length-Extensional Resonators
    • Giessibl, F. J.; Pielmeier, F.; Eguchi, T.; An, T.; Hasegawa, Y. Comparison of Force Sensors for Atomic Force Microscopy Based on Quartz Tuning Forks and Length-Extensional Resonators Phys. Rev. B 2011, 84, 125409
    • (2011) Phys. Rev. B , vol.84 , pp. 125409
    • Giessibl, F.J.1    Pielmeier, F.2    Eguchi, T.3    An, T.4    Hasegawa, Y.5
  • 62
    • 33751552371 scopus 로고    scopus 로고
    • Weak Chemical Interaction and van der Waals Forces between Graphene Layers: A Combined Density Functional and Intermolecular Perturbation Theory Approach
    • Dappe, Y. J.; Basanta, M. A.; Flores, F.; Ortega, J. Weak Chemical Interaction and van der Waals Forces Between Graphene Layers: A Combined Density Functional and Intermolecular Perturbation Theory Approach Phys. Rev. B 2006, 74, 205434
    • (2006) Phys. Rev. B , vol.74 , pp. 205434
    • Dappe, Y.J.1    Basanta, M.A.2    Flores, F.3    Ortega, J.4
  • 63
    • 65649102227 scopus 로고    scopus 로고
    • Intermolecular Interaction in Density Functional Theory: Application to Carbon Nanotubes and Fullerenes
    • Dappe, Y.; Ortega, J.; Flores, F. Intermolecular Interaction in Density Functional Theory: Application to Carbon Nanotubes and Fullerenes Phys. Rev. B 2009, 79, 165409
    • (2009) Phys. Rev. B , vol.79 , pp. 165409
    • Dappe, Y.1    Ortega, J.2    Flores, F.3
  • 66
    • 36048938243 scopus 로고    scopus 로고
    • Atomic Scale Study of the Chemistry of Oxygen, Hydrogen and Water at SiC Surfaces
    • Amy, F. Atomic Scale Study of the Chemistry of Oxygen, Hydrogen and Water at SiC Surfaces J. Phys. D: Appl. Phys. 2007, 40, 6201-6214
    • (2007) J. Phys. D: Appl. Phys. , vol.40 , pp. 6201-6214
    • Amy, F.1
  • 68
    • 0040645481 scopus 로고    scopus 로고
    • Atomic Structure of Hexagonal SiC Surfaces
    • Starke, U. Atomic Structure of Hexagonal SiC Surfaces Phys. Status Solidi B 1997, 202, 475-499
    • (1997) Phys. Status Solidi B , vol.202 , pp. 475-499
    • Starke, U.1
  • 69
    • 0034667044 scopus 로고    scopus 로고
    • Crystallography of the (3 × 3) Surface Reconstruction of 3 C -SiC(111), 4 H -SiC(0001), and 6 H -SiC(0001) Surfaces Retrieved by Low-Energy Electron Diffraction
    • Schardt, J.; Bernhardt, J.; Starke, U.; Heinz, K. Crystallography of the (3 × 3) Surface Reconstruction of 3 C -SiC(111), 4 H -SiC(0001), and 6 H -SiC(0001) Surfaces Retrieved by Low-Energy Electron Diffraction Phys. Rev. B 2000, 62, 10335-10344
    • (2000) Phys. Rev. B , vol.62 , pp. 10335-10344
    • Schardt, J.1    Bernhardt, J.2    Starke, U.3    Heinz, K.4
  • 71
    • 0031618875 scopus 로고    scopus 로고
    • Energetics of the α-SiC(0001)-(3 × 3) Surface Reconstruction
    • Badziag, P. Energetics of the α-SiC(0001)-(3 × 3) Surface Reconstruction Surf. Sci. 1998, 402-404, 822-826
    • (1998) Surf. Sci. , vol.402-404 , pp. 822-826
    • Badziag, P.1
  • 74
    • 77957140704 scopus 로고    scopus 로고
    • Fullerene Adsorption on Semiconductor Surfaces
    • Moriarty, P. J. Fullerene Adsorption on Semiconductor Surfaces Surf. Sci. Rep. 2010, 65, 175-227
    • (2010) Surf. Sci. Rep. , vol.65 , pp. 175-227
    • Moriarty, P.J.1
  • 77
    • 84861899865 scopus 로고    scopus 로고
    • Stability of Small Chemical Groups on Hexagonal-SiC(0001) Surfaces: A Theoretical Study
    • Spillebout, F.; Stauffer, L.; Sonnet, P.; Mayne, A. Stability of Small Chemical Groups on Hexagonal-SiC(0001) Surfaces: A Theoretical Study Surf. Sci. 2012, 606, 1195-1202
    • (2012) Surf. Sci. , vol.606 , pp. 1195-1202
    • Spillebout, F.1    Stauffer, L.2    Sonnet, P.3    Mayne, A.4
  • 81
    • 1442360648 scopus 로고    scopus 로고
    • 60 on the Si(001) Surface Calculated Within the Generalized Gradient Approximation
    • 60 on the Si(001) Surface Calculated Within the Generalized Gradient Approximation Nanotechnology 2004, 15, S1-S4
    • (2004) Nanotechnology , vol.15
    • Hobbs, C.1    Kantorovich, L.2
  • 84
    • 31644434621 scopus 로고    scopus 로고
    • 60 Molecule Adsorbed on the Si(001) Surface: An ab initio Method
    • 60 Molecule Adsorbed on the Si(001) Surface: An ab initio Method Surf. Sci. 2006, 600, 551-558
    • (2006) Surf. Sci. , vol.600 , pp. 551-558
    • Hobbs, C.1    Kantorovich, L.2
  • 86
    • 47549107296 scopus 로고    scopus 로고
    • Constrained Molecular Manipulation Mediated by Attractive and Repulsive Tip-Adsorbate Forces
    • Martsinovich, N.; Kantorovich, L.; Fawcett, R. H. J.; Humphry, M. J.; Beton, P. H. Constrained Molecular Manipulation Mediated by Attractive and Repulsive Tip-Adsorbate Forces Small 2008, 4, 765-769
    • (2008) Small , vol.4 , pp. 765-769
    • Martsinovich, N.1    Kantorovich, L.2    Fawcett, R.H.J.3    Humphry, M.J.4    Beton, P.H.5
  • 87
    • 41549158131 scopus 로고    scopus 로고
    • 60 Molecule on a Si(001) Surface with an STM Tip: A Theoretical Study
    • 60 Molecule on a Si(001) Surface with an STM Tip: A Theoretical Study Phys. Rev. B 2008, 77, 115429
    • (2008) Phys. Rev. B , vol.77 , pp. 115429
    • Martsinovich, N.1    Kantorovich, L.2
  • 89
    • 44449174648 scopus 로고    scopus 로고
    • Contact to Single Atoms and Molecules with the Tip of a Scanning Tunnelling Microscope
    • Kröger, J.; Néel, N.; Limot, L. Contact to Single Atoms and Molecules with the Tip of a Scanning Tunnelling Microscope J. Phys.: Condens. Matter 2008, 20, 223001
    • (2008) J. Phys.: Condens. Matter , vol.20 , pp. 223001
    • Kröger, J.1    Néel, N.2    Limot, L.3
  • 96
    • 80051609627 scopus 로고    scopus 로고
    • Charge Injection through Single and Double Carbon Bonds
    • Schull, G.; Dappe, Y. J.; González, C.; Bulou, H.; Berndt, R. Charge Injection through Single and Double Carbon Bonds Nano Lett. 2011, 11, 3142-3146
    • (2011) Nano Lett. , vol.11 , pp. 3142-3146
    • Schull, G.1    Dappe, Y.J.2    González, C.3    Bulou, H.4    Berndt, R.5
  • 101
    • 84872282037 scopus 로고    scopus 로고
    • Forces during the Controlled Displacement of Organic Molecules
    • Langewisch, G.; Falter, J.; Fuchs, H.; Schirmeisen, A. Forces During the Controlled Displacement of Organic Molecules Phys. Rev. Lett. 2013, 110, 036101
    • (2013) Phys. Rev. Lett. , vol.110 , pp. 036101
    • Langewisch, G.1    Falter, J.2    Fuchs, H.3    Schirmeisen, A.4
  • 102
    • 0042561784 scopus 로고    scopus 로고
    • Tip Models and Force Definitions in Molecular Dynamics Simulations of Scanning Force Microscopy
    • Trevethan, T.; Kantorovich, L. Tip Models and Force Definitions in Molecular Dynamics Simulations of Scanning Force Microscopy Surf. Sci. 2003, 540, 497-503
    • (2003) Surf. Sci. , vol.540 , pp. 497-503
    • Trevethan, T.1    Kantorovich, L.2


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