A virtual dynamic atomic force microscope for image calculations

Journal of Applied Physics

Volumn 97, Issue 4, 2005, Pages

  Polesel Maris, Jérôme ^a   Gauthier, Sébastien ^a  

^a CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE REGULATIONS; CANTILEVER; IMAGE SIMULATION; SCANNING SPEED;

COMPUTER SIMULATION; CONTROL SYSTEMS; FREQUENCY MODULATION; IMAGE ANALYSIS; NATURAL FREQUENCIES; OSCILLATIONS; PHASE LOCKED LOOPS; SCANNING;

ATOMIC FORCE MICROSCOPY;

EID: 13744251846     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1841462     Document Type: Article

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