Damping and instability in non-contact atomic force microscopy: The contribution of the instrument

Nanotechnology

Volumn 16, Issue 8, 2005, Pages 1346-1353

  Couturier, G ^a   Boisgard, R ^a   Dietzel, D ^a   Aime J P ^a  

^a UMR 5798   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL EQUIPMENT; CURVE FITTING; DAMPING; FREQUENCIES; GAIN CONTROL; OSCILLATIONS; STABILITY; ULTRAHIGH VACUUM;

AUTOMATIC GAIN CONTROL (AGC); CANTILEVERS; DAMPING SIGNALS; ERROR SIGNALS;

MICROSCOPIC EXAMINATION;

EID: 21144451034     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/8/061     Document Type: Article

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