Noncontact atomic force microscopy simulator with phase-locked-loop controlled frequency detection and excitation

Physical Review B - Condensed Matter and Materials Physics

Volumn 74, Issue 23, 2006, Pages

  Nony, Laurent ^a   Baratoff, Alexis ^b   Schär, Dominique ^b   Pfeiffer, Oliver ^b   Wetzel, Adrian ^b   Meyer, Ernst ^b  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33846280095     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.235439     Document Type: Article

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