Theoretical study of the atomic-force-microscopy imaging process on the NaCl(001) surface

Journal of Chemical Physics

Volumn 108, Issue 1, 1998, Pages 359-367

  Tang, Hao ^a   Bouju, Xavier ^b   Joachim, Christian ^a   Girard, Christian ^a   Devillers, Jean ^a  

^a CEMES CNRS   (France)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCULATIONS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; IMAGE ANALYSIS; MATHEMATICAL MODELS; RELAXATION PROCESSES; SODIUM CHLORIDE; SUBSTRATES;

CORRUGATION; SUPERMOLECULE MOLECULAR MECHANICS;

SURFACES;

EID: 0031698096     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.475383     Document Type: Article

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