Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator

Review of Scientific Instruments

Volumn 83, Issue 1, 2012, Pages

  Kiracofe, Daniel ^a   Melcher, John ^a   Raman, Arvind ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; COMPLEX ENVIRONMENTS; CYBER INFRASTRUCTURES; DYNAMIC ATOMIC FORCE MICROSCOPY; EFFECTIVE TOOL; EXCITATION METHODS; EXPERIMENTAL DATA; GAINING INSIGHTS; HYDRATION FORCE; LIQUID ENVIRONMENT; MATERIAL SYSTEMS; MATHEMATICAL SIMULATIONS; MODES OF OPERATION; OPEN-SOURCE; OPERATING MODES; PRACTICAL PROBLEMS; SIMULATION TOOL; SOLVATION SHELL; SURFACE PHYSICS; VACUUM ENVIRONMENT; VAN DER WAALS;

ADHESION; ATOMIC FORCE MICROSCOPY; LIQUIDS; VAN DER WAALS FORCES; VIRTUAL REALITY;

DYNAMICS;

EID: 84857298566     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3669638     Document Type: Review

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