Atomic-scale mechanical properties of orientated C60 molecules revealed by noncontact atomic force microscopy

ACS Nano

Volumn 5, Issue 8, 2011, Pages 6349-6354

  Pawlak, Rémy ^a   Kawai, Shigeki ^a   Fremy, Sweetlana ^a   Glatzel, Thilo ^a   Meyer, Ernst ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

fullerene C60; high resolution imaging; local force variation; noncontact atomic force microscopy; scanning tunnelling microscopy; three dimensional dynamic force spectroscopy

Indexed keywords

FORCE VARIATION; FULLERENE C; HIGH-RESOLUTION IMAGING; NONCONTACT ATOMIC FORCE MICROSCOPY; THREE-DIMENSIONAL DYNAMICS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; MOLECULES; SCANNING TUNNELING MICROSCOPY;

MECHANICAL PROPERTIES;

EID: 80052053964     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn201462g     Document Type: Article

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