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Chemical Communications

Volumn 47, Issue 38, 2011, Pages 10575-10577

Measuring Si-C60 chemical forces via single molecule spectroscopy

(4) Chiutu, Cristina a Stannard, Andrew a Sweetman, Adam M a Moriarty, Philip a

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; FULLERENE; SILICON;

ADSORPTION; ATOMIC FORCE MICROSCOPY; ATOMIC PARTICLE; FORCE; FREQUENCY MODULATION; MOLECULAR INTERACTION; REVIEW;

EID: 80052948225 PISSN: 13597345 EISSN: 1364548X Source Type: Journal
DOI: 10.1039/c1cc14147c Document Type: Review

Times cited : (7)

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