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Volumn 22, Issue 4, 2011, Pages

The role of the tip in non-contact atomic force microscopy dissipation images of ionic surfaces

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC SCALE; ATOMISTIC MODELS; DISSIPATED ENERGY; FLAT SURFACES; FREQUENCY SHIFT; IONIC CRYSTALS; IONIC SURFACES; NONCONTACT ATOMIC FORCE MICROSCOPY; SCANNING SPEED; THEORY OF DYNAMICS;

EID: 79251574155     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/4/045702     Document Type: Article
Times cited : (22)

References (67)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.