Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy: CaF2(111) as a reference surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 66, Issue 23, 2002, Pages 2354171-23541710

  Foster, Adam S ^d   Barth, Clemens ^a   Shluger, Alexander L ^b   Nieminen, Risto M ^d   Reichling, Michael ^c  

^a CAMPUS DE LUMINY   (France)

^b UNIVERSITY COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF MUNICH   (Germany)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRICITY; IMAGE RECONSTRUCTION; QUALITATIVE ANALYSIS; REPRODUCIBILITY; STRUCTURE ANALYSIS; SURFACE PROPERTY; THEORETICAL MODEL;

EID: 0037116186     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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