Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 12, 2011, Pages

  Giessibl, Franz J ^a   Pielmeier, Florian ^a   Eguchi, Toyoaki ^b,c   An, Toshu ^d   Hasegawa, Yukio ^e  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KEIO UNIVERSITY   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80053899900     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.125409     Document Type: Article

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