The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips

New Journal of Physics

Volumn 12, Issue , 2010, Pages

  Moll, Nikolaj ^a   Gross, Leo ^a   Mohn, Fabian ^a   Curioni, Alessandro ^a   Meyer, Gerhard ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; ATOMIC RESOLUTION; CHEMICAL NATURE; CO MOLECULE; ELECTROSTATIC INTERACTIONS; ENERGY CONTRIBUTION; FIRST-PRINCIPLES CALCULATION; FREQUENCY SHIFT; FUNCTIONALIZED; HIGH RESOLUTION; PAULI REPULSION; PENTACENES; TIP-SAMPLE INTERACTION; VAN DER WAALS;

ATOMIC FORCE MICROSCOPY; VAN DER WAALS FORCES;

MOLECULES;

EID: 78651282174     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/12/12/125020     Document Type: Article

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