Structure and stability of semiconductor tip apexes for atomic force microscopy

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Pou, P ^a   Ghasemi, S A ^b   Jelinek, P ^c   Lenosky, T ^d   Goedecker, S ^b   Perez, R ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF BASEL   (Switzerland)

^c INSTITUTE OF PHYSICS   (Czech Republic)

^d Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC CONTACTS; ATOMIC LAYER; ATOMIC RESOLUTION; ATOMIC SCALE; ATOMIC STRUCTURE; COMMON STRUCTURES; DYNAMIC FORCE SPECTROSCOPY; FIRST-PRINCIPLES SIMULATIONS; FORCE-DISTANCE CURVES; SEMI-CONDUCTOR SURFACES; SHARP TIP; SHORT-RANGE FORCES; SI CLUSTERS; SINGLE ATOMS; STABLE SOLUTIONS; SURFACE ATOMS; SYSTEMATIC STUDY; THERMODYNAMICALLY STABLE; TIP APEX; TIP-SURFACE INTERACTION;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; SILICON; SIMULATED ANNEALING;

CRYSTAL ATOMIC STRUCTURE;

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; PRIORITY JOURNAL; SEMICONDUCTOR; THERMODYNAMICS;

EID: 67649366119     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264015     Document Type: Article

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