Bond-order discrimination by atomic force microscopy

Science

Volumn 337, Issue 6100, 2012, Pages 1326-1329

  Gross, Leo ^a   Mohn, Fabian ^a   Moll, Nikolaj ^a   Schuler, Bruno ^a   Criado, Alejandro ^b   Guitián, Enrique ^b   Peña, Diego ^b   Gourdon, André ^c   Meyer, Gerhard ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b UNIVERSITY OF SANTIAGO DE COMPOSTELA   (Spain)

^c CEMES CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON MONOXIDE; FULLERENE DERIVATIVE; HEXABENZOCORONENE; POLYCYCLIC AROMATIC HYDROCARBON; UNCLASSIFIED DRUG;

ATOMIC FORCE MICROSCOPY; CARBON MONOXIDE; DISCRIMINANT ANALYSIS; ELECTRON; FULLERENE; MOLECULAR ANALYSIS; PAH; RESOLUTION;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL BOND; DENSITY FUNCTIONAL THEORY; ELECTRON DIFFRACTION; MICROSCOPE IMAGE; NEUTRON DIFFRACTION; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 84866128037     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1225621     Document Type: Article

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