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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 15, 2000, Pages 10335-10344

Crystallography of the (3×3) surface reconstruction of 3C-SiC(111), 4H-SiC(0001), and 6H-SiC(0001) surfaces retrieved by low-energy electron diffraction

(4) Schardt, J a Bernhardt, J a Starke, U a Heinz, K a

a UNIVERSITY OF ERLANGEN NUREMBERG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; HYDROGEN; SILICON;

ARTICLE; AUGER ELECTRON SPECTROSCOPY; CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ENERGY; HOLOGRAPHY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR;

EID: 0034667044 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.10335 Document Type: Article

Times cited : (87)

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