SCOPUS 정보 검색 플랫폼

EPJ Applied Physics

Volumn 15, Issue 2, 2001, Pages 141-147

A virtual non contact-atomic force microscope (NC-AFM): Simulation and comparison with analytical models

(4) Couturier, G a Aime J P a Salardenne, J a Boisgard, R a

a UNIVERSITÉ DE BORDEAUX (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER PROGRAMMING LANGUAGES; COMPUTER SIMULATION; DAMPING; DEFORMATION; DIFFERENTIAL EQUATIONS; DIGITAL DEVICES; GAIN CONTROL; IMAGE RECORDING; MATHEMATICAL MODELS; PIEZOELECTRIC MATERIALS; TRANSFER FUNCTIONS; VAN DER WAALS FORCES; VIRTUAL REALITY;

NONLINEAR COUPLED DIFFERENTIAL EQUATIONS; VIRTUAL MACHINES;

IMAGING SYSTEMS;

EID: 0035421779 PISSN: 12860042 EISSN: None Source Type: Journal
DOI: 10.1051/epjap:2001175 Document Type: Article

Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.