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NanoScience and Technology

Volumn 116, Issue , 2011, Pages 691-721

Conductive atomic-force microscopy investigation of nanostructures in microelectronics

(2) Teichert, Christian a Beinik, Igor a

a NONE

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[No Author keywords available]

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EID: 84867013245 PISSN: 14344904 EISSN: None Source Type: Book Series
DOI: 10.1007/978-3-642-10497-8_23 Document Type: Article

Times cited : (16)

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