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Volumn 45, Issue 4 B, 2006, Pages 3672-3679
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Carbon nanotube transistor fabrication assisted by topographical and conductive atomic force microscopy
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Author keywords
C AFM; CMOS; CNT; CNT FET; CVD; Nanocluster
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CARBON NANOTUBES;
CATALYSTS;
CHEMICAL VAPOR DEPOSITION;
CMOS INTEGRATED CIRCUITS;
ELECTRODES;
OPTIMIZATION;
CATALYST METALS;
CNT-FET FABRICATIONS;
DRAIN ELECTRODES;
GEOMETRICAL PROPERTIES;
SOURCE ELECTRODES;
FIELD EFFECT TRANSISTORS;
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EID: 33646904788
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.3672 Document Type: Article |
Times cited : (14)
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References (15)
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