The current image of a single CuO nanowire studied by conductive atomic force microscopy

Applied Physics Letters

Volumn 92, Issue 22, 2008, Pages

  Cheng, Gang ^a,b   Wang, Shujie ^b   Cheng, Ke ^b   Jiang, Xiaohong ^b   Wang, Lixiang ^b   Li, Linsong ^b   Du, Zuliang ^b   Zou, Guangtian ^a  

^a JILIN UNIVERSITY   (China)

^b HENAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; COPPER OXIDES; ELECTRIC WIRE; MICROSCOPES; MICROSCOPIC EXAMINATION; NANOSTRUCTURES; NANOWIRES; SCANNING PROBE MICROSCOPY; SCHOTTKY BARRIER DIODES; SURFACE PROPERTIES; SURFACES;

(P ,P ,T) MEASUREMENTS; (PL) PROPERTIES; AMERICAN INSTITUTE OF PHYSICS (AIP); BARRIER HEIGHT (BH); CONDUCTIVE ATOMIC FORCE MICROSCOPY (C AFM); CURRENT IMAGING; KELVIN PROBE FORCE MICROSCOPY (KPFM); NANO WIRES; SCHOTTKY BARRIER (SB); SURFACE STATES;

IMAGING TECHNIQUES;

EID: 44849122799     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2938694     Document Type: Article

References (27)

1. Z. W. Pan, Z. R. Dai, and Z. L. Wang, Science SCIEAS 0036-8075 10.1126/science.1058120 291, 1947 (2001).
2. X. F. Duan, Y. Huang, Y. Cui, J. F. Wang, and C. M. Lieber, Nature (London) NATUAS 0028-0836 10.1038/35051047 409, 66 (2001).
3. C. Y. Nam, J. Y. Kim, and J. E. Fischer, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1925775 86, 193112 (2005).
4. Y. Long, Z. Chen, W. Wang, F. Bai, A. Jin, and C. Gu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1900950 86, 153102 (2005).
5. K. Cheng, G. Cheng, S. J. Wang, L. S. Li, S. X. Dai, X. T. Zhang, B. S. Zou, and Z. L. Du, New J. Phys. NJOPFM 1367-2630 10.1088/1367-2630/9/7/214 9, 214 (2007).
6. C. Soci, A. Zhang, B. Xiang, S. A. Dayeh, D. P. R. Aplin, J. Park, X. Y. Bao, Y. H. Lo, and D. Wang, Nano Lett. NALEFD 1530-6984 10.1021/nl070111x 7, 1003 (2007).
7. Z. Fan, P. C. Chang, J. G. Lu, E. C. Walter, R. M. Penner, C. H. Lin, and H. P. Lee, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1841453 85, 6128 (2004).
8. I. Shalish, H. Temkin, and V. Narayanamurti, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.245401 69, 245401 (2004).
9. N. Malkova and C. Z. Ning, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.74.155308 74, 155308 (2006).
10. C. R. Leao, A. Fazzio, and A. J. R. D. Silva, Nano Lett. NALEFD 1530-6984 10.1021/nl0628697 7, 1172 (2007).
11. H. Luth, Surfaces and Interfaces of Solids (Springer, Berlin, 1993).
12. E. H. Nicollian and J. R. Brews, MOS Physics and Technology (Wiley, New York, 1982).
13. L. Kronik, L. Burstein, and Y. Shapira, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.109751 63, 60 (1993).
14. S. Saraf, A. Schwarzman, Y. Dvash, S. Cohen, D. Ritter, and Y. Rosenwaks, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.73.035336 73, 035336 (2006).
15. W. A. Hofer and A. G. Lekue, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.085401 71, 085401 (2005).
16. A. O. Musa, T. Akomolafe, and M. J. Carter, Sol. Energy Mater. Sol. Cells SEMCEQ 0927-0248 10.1016/S0927-0248(97)00233-X 51, 305 (1998).
17. W. Y. Ching, Y. Xu, and K. W. Wong, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.40.7684 40, 7684 (1989).
18. X. Jiang, T. Herricks, and Y. Xia, Nano Lett. NALEFD 1530-6984 10.1021/nl0257519 2, 1333 (2002).
19. G. H. Du and G. V. Tendeloo, Chem. Phys. Lett. CHPLBC 0009-2614 10.1016/j.cplett.2004.06.017 393, 64 (2004).
20. J. Chen, S. Z. Deng, N. S. Xu, W. Zhang, X. Wen, and S. Yang, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1595156 83, 746 (2003).
21. J. Chen, N. Y. Huang, S. Z. Deng, J. C. She, N. S. Xu, W. Zhang, X. Wen, and S. Yang, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1901811 86, 151107 (2005).
22. H. Wu, D. Lin, and W. Pan, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2355474 89, 133125 (2006).
23. S. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, New York, 1981).
24. C. Y. Nam, D. Tham, and J. E. Fischer, Nano Lett. NALEFD 1530-6984 10.1021/nl0515697 5, 2029 (2005).
25. Z. Y. Zhang, C. H. Jin, X. L. Liang, Q. Chen, and L. M. Peng, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2177362 88, 073102 (2006).
26. S. J. Wang, G. Cheng, X. H. Jiang, Y. C. Li, Y. B. Huang, and Z. L. Du, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2207498 88, 212108 (2006).
27. S. C. Erwin, L. Zu, M. I. Haftel, A. L. Efros, T. A. Kennedy, and D. J. Norris, Nature (London) NATUAS 0028-0836 10.1038/nature03832 436, 91 (2005).