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Volumn 21, Issue 7, 1996, Pages 40-45

Degradation mechanisms in ferroelectric and high-permittivity perovskites

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CRYSTAL DEFECTS; DEGRADATION; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; OXYGEN; PERMITTIVITY; PEROVSKITE; POLARIZATION; SINGLE CRYSTALS; THIN FILMS;

EID: 0030193126     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400035909     Document Type: Article
Times cited : (136)

References (29)
  • 9
    • 0027810981 scopus 로고
    • Ferroelectric Thin Films III, edited by B.A. Tuttle, E.R. Myers, S.B. Desu, and P.K. Larsen, Pittsburgh
    • I.K. Yoo, S.B. Desu, and J. Xing, in Ferroelectric Thin Films III, edited by B.A. Tuttle, E.R. Myers, S.B. Desu, and P.K. Larsen (Mater. Res. Soc. Symp. Proc. 310, Pittsburgh, 1993) p. 165.
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.310 , pp. 165
    • Yoo, I.K.1    Desu, S.B.2    Xing, J.3
  • 26
  • 29
    • 0004225848 scopus 로고
    • edited by N. Setter and E.L. Colla (Birkhauser ce Verlag)
    • R. Waser, Ferroelectric Ceramics, edited by N. Setter and E.L. Colla (Birkhauser ce Verlag, 1993).
    • (1993) Ferroelectric Ceramics
    • Waser, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.