Nanometer-scale photoelectric property of organic thin films investigated by a photoconductive atomic force microscope

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 6 B, 1999, Pages 3908-3911

  Sakaguchi, Hiroshi ^a   Iwata, Futoshi ^a   Hirai, Atsushi ^a   Sasaki, Akira ^a   Nagamura, Toshihiko ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COPPER; CURRENT VOLTAGE CHARACTERISTICS; LASER APPLICATIONS; LASER BEAM EFFECTS; PHOTOCONDUCTING MATERIALS; PHOTOCONDUCTIVITY; PHOTOCURRENTS; POINT CONTACTS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILMS;

ORGANIC THIN FILMS; PHOTOCONDUCTIVE ATOMIC FORCE MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 0032594502     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.3908     Document Type: Article

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