High resolution Fowler-Nordheim field emission maps of thin silicon oxide layers

Applied Physics Letters

Volumn 68, Issue 1, 1996, Pages 93-95

  Ruskell, Todd G ^a   Workman, Richard K ^a   Chen, Dong ^a   Sarid, Dror ^a   Dahl, Sarah ^b   Gilbert, Stephen ^b  

^a UNIVERSITY OF ARIZONA   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002001568     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116782     Document Type: Article

References (10)

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7. Controlled with software and hardware from Intelligent Instrumentation, 6550 S. Bay Colony Drive, MS130, Tucson, AZ 85706.
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