Novel ultrananocrystalline diamond probes for high-resolution low-wear nanolithographic techniques

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Volumn 1, Issue 8-9, 2005, Pages 866-874

  Kim, Keun Ho ^a   Moldovan, Nicolaie ^a   Ke, Changhong ^a   Espinosa, Horacio D ^a   Xiao, Xingcheng ^b   Carlisle, John A ^b   Auciello, Orlando ^b  

^a Northwestern University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

AFM; Diamond; Dip pen nanolithography; Nanocrystalline materials; Probe tips

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; DIAMOND CUTTING TOOLS; ELECTROFORMING; FILM GROWTH; NANOSTRUCTURED MATERIALS; PROBES; WEAR OF MATERIALS;

DIP-PEN NANOLITHOGRAPHY; PROBE TIPS;

NANOTECHNOLOGY;

BIOMATERIAL; DIAMOND; GOLD; NANOMATERIAL; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; ELECTRICITY; ELECTROCHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY;

COATED MATERIALS, BIOCOMPATIBLE; CRYSTALLIZATION; DIAMOND; ELECTROCHEMISTRY; ELECTROSTATICS; GOLD; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOSTRUCTURES; NANOTECHNOLOGY; SEMICONDUCTORS; SILICON; SURFACE PROPERTIES;

EID: 33745479974     PISSN: 16136810     EISSN: 16136829     Source Type: Journal    
DOI: 10.1002/smll.200500028     Document Type: Article

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