Breakdown kinetics of Pr2 O3 films by conductive-atomic force microscopy

Applied Physics Letters

Volumn 87, Issue 23, 2005, Pages 1-3

  Fiorenza, Patrick ^a,b   Lo Nigro, Raffaella ^a   Raineri, Vito ^a   Lombardo, Salvatore ^a   Toro, Roberta G ^b   Malandrino, Graziella ^b   Fragal̀, Ignazio L ^b  

^a CNR IMM   (Italy)

^b UNIVERSITY OF CATANIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY (OPTICAL); DIELECTRIC AMPLIFIERS; MEASUREMENTS; MICROSCOPES; PRASEODYMIUM; THIN FILMS;

BREAKDOWN KINETICS; CONDUCTIVE-ATOMIC FORCE; NANOMETER SCALE; WEIBULL SLOPE;

REACTION KINETICS;

EID: 28444494696     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2140883     Document Type: Article

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