Dielectric degradation and microstructures of heterogeneous interfaces in cofired multilayer ceramic capacitors

Journal of Electroceramics

Volumn 14, Issue 3, 2005, Pages 213-220

  Feng, Qiquan ^a   McConville, Caspar J ^a  

^a New York State College of Ceramics at Alfred University   (United States)

Author keywords

Dielectric degradation; Interfaces; MLCCs; TEM; Tripod polishing

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC POTENTIAL; ELECTRODES; INTERFACES (MATERIALS); MICROANALYSIS; MICROSTRUCTURE; MULTILAYERS; TRANSMISSION ELECTRON MICROSCOPY;

DIELECTRIC DEGRADATION; INTERFACES; MULTILAYER CERAMIC CAPACITORS (MLCC); TRIPOD-POLISHING;

CERAMIC CAPACITORS;

EID: 17444408142     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10832-005-0960-9     Document Type: Article

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