ELDRS in bipolar linear circuits: A review

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2008, Pages 18-32

  Pease, Ronald L ^a   Schrimpf, Ronald D ^b   Fleetwood, Daniel M ^b  

^a RLP Research   (United States)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

accelerated testing; bipolar linear circuits; dose rate effects; Enhanced low dose rate sensitivity; hardness assurance; low dose rate enhancement factor; total dose

Indexed keywords

ACCELERATED TESTING; BIPOLAR LINEAR CIRCUITS; DOSE-RATE EFFECTS; ENHANCED LOW-DOSE-RATE SENSITIVITY; HARDNESS ASSURANCE; LOW DOSE RATE; TOTAL DOSE;

DOSIMETRY; HARDNESS; IONIZING RADIATION; PASSIVATION; RESEARCH;

HARDNESS TESTING;

EID: 79960628301     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2008.5782678     Document Type: Conference Paper

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