메뉴 건너뛰기




Volumn 60, Issue 1, 2011, Pages

Progress in rare earth doped Hf-based high-k gate dielectrics

Author keywords

Effective work function; Hf based high k gate dielectrics; Oxygen vacancies; Rare earth doping

Indexed keywords


EID: 79952515392     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (8)

References (63)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.