메뉴 건너뛰기




Volumn 3, Issue 2, 2011, Pages 490-502

Resistive switching memory: Observations with scanning probe microscopy

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACIAL EFFECTS; MEMORY DEVICE; NON-VOLATILE; RESISTANCE SWITCHING; RESISTIVE SWITCHING; RESISTIVE SWITCHING MEMORIES; SCANNING PROBE MEASUREMENTS;

EID: 79951604400     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c0nr00580k     Document Type: Review
Times cited : (104)

References (91)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.