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Volumn 3, Issue 2, 2011, Pages 490-502
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Resistive switching memory: Observations with scanning probe microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
INTERFACIAL EFFECTS;
MEMORY DEVICE;
NON-VOLATILE;
RESISTANCE SWITCHING;
RESISTIVE SWITCHING;
RESISTIVE SWITCHING MEMORIES;
SCANNING PROBE MEASUREMENTS;
INFORMATION TECHNOLOGY;
PROBES;
SCANNING;
SWITCHING;
SWITCHING SYSTEMS;
SCANNING PROBE MICROSCOPY;
CHALCOGEN;
CHEMISTRY;
ELECTROCHEMICAL ANALYSIS;
NANOTECHNOLOGY;
REVIEW;
SCANNING PROBE MICROSCOPY;
CHALCOGENS;
ELECTROCHEMICAL TECHNIQUES;
MICROSCOPY, SCANNING PROBE;
NANOTECHNOLOGY;
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EID: 79951604400
PISSN: 20403364
EISSN: 20403372
Source Type: Journal
DOI: 10.1039/c0nr00580k Document Type: Review |
Times cited : (104)
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References (91)
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