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Applied Physics Letters

Volumn 96, Issue 21, 2010, Pages

Nanoscale imaging and control of resistance switching in VO2 at room temperature

(5) Kim, Jeehoon a Ko, Changhyun a Frenzel, Alex a Ramanathan, Shriram a Hoffman, Jennifer E a

a HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; INSULATOR-TO-METAL TRANSITIONS; LOCAL PHASE; LOW TEMPERATURES; MICROSCOPIC MECHANISMS; NANO-SCALE IMAGING; RESISTANCE SWITCHING; ROOM TEMPERATURE; VOLTAGE SWEEP;

IMAGING TECHNIQUES; SOLID STATE DEVICES;

METAL INSULATOR TRANSITION;

EID: 77956252680 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3435466 Document Type: Article

Times cited : (137)

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