Geometric artefact suppressed surface potential measurements

Nanotechnology

Volumn 17, Issue 15, 2006, Pages 3728-3733

  Lee, Minhwan ^a   Lee, Wonyoung ^a   Prinz, Fritz B ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC GENERATION; IMAGING SYSTEMS; MICROSCOPIC EXAMINATION; SIGNAL PROCESSING; SURFACE PHENOMENA; TOPOLOGY;

ELECTRIC FORCE MEASUREMENT; KELVIN PROBE MICROSCOPY (KPM); SCANNING PROBE MICROSCOPY (SPM); SURFACE POTENTIAL (SP);

NANOTECHNOLOGY;

EID: 33748911862     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/15/019     Document Type: Article

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