Phase change recording using a scanning near-field optical microscope

Journal of Applied Physics

Volumn 79, Issue 10, 1996, Pages 8082-8086

  Hosaka, Sumio ^a   Shintani, Toshimichi ^a   Miyamoto, Mitsuhide ^a   Kikukawa, Atsushi ^a   Hirotsune, Akemi ^a   Terao, Motoyasu ^a   Yoshida, Masaru ^a   Fujita, Kouichi ^b   Kämmer, Stefan ^c  

^a HITACHI LTD   (Japan)

^b Nissei Sangyo Co Ltd   (Japan)

^c TopoMetrix Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000888032     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362363     Document Type: Article

References (9)

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