SCOPUS 정보 검색 플랫폼

Volumn 120, Issue 1-2, 1997, Pages 171-179

Observation of short-wavelength recorded pits in GeSb 2 Te 4 phase change thin film by atomic force microscopy

Author keywords

AFM (atomic force microscopy); FFM (frictional force microscopy); Optical storage; Phase change materials; Short wavelength recording

Indexed keywords

ATOMIC FORCE MICROSCOPY; LASER BEAM EFFECTS; MICROSTRUCTURE; MORPHOLOGY; OPTICAL DISK STORAGE; THIN FILMS;

PHASE CHANGE MATERIAL; SHORT WAVELENGTH RECORDING;

GERMANIUM COMPOUNDS;

EID: 0031269625 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(97)00247-X Document Type: Article

Times cited : (6)

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