Nanoscale electrical phase-change in GeSb2Te4 films with scanning probe microscopes

Journal of Non-Crystalline Solids

Volumn 299-302, Issue PART 2, 2002, Pages 968-972

  Gotoh, Tamihiro ^a   Sugawara, Kentaro ^a   Tanaka, Keiji ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE; GERMANIUM COMPOUNDS; LITHOGRAPHY; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

SCANNING PROBE MICROSCOPES;

AMORPHOUS FILMS;

EID: 0036530860     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)01061-4     Document Type: Article

References (11)