Simultaneous force and conduction measurements in atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 23, 1997, Pages 15345-15352

  Lantz, M ^a   O'Shea S ^a   Welland, M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000634089     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.15345     Document Type: Article

References (36)

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