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Volumn 96, Issue 5, 2010, Pages

Direct investigation on conducting nanofilaments in single-crystalline Ni/NiO core/shell nanodisk arrays

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTING ATOMIC FORCE MICROSCOPY; CONDUCTING FILAMENT; CONTACT AREAS; CONTACT PARAMETERS; CONTACT TIME; CORE/SHELL; CURRENT DISTRIBUTION; ELECTRODE SIZE; METAL OXIDES; NANOBLOCKS; NANODISK ARRAYS; NANODISKS; NANOFILAMENTS; RESISTIVE SWITCHING; SINGLE-CRYSTALLINE; STRESS TIME; STRESS-INDUCED;

EID: 76449115642     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3301620     Document Type: Article
Times cited : (22)

References (15)
  • 13
    • 34250658118 scopus 로고    scopus 로고
    • Localized switching mechanism in resistive switching of atomic-layer-deposited Ti O2 thin films
    • DOI 10.1063/1.2748312
    • K. M. Kim, B. J. Choi, and C. S. Hwang, Appl. Phys. Lett. 0003-6951 90, 242906 (2007). 10.1063/1.2748312 (Pubitemid 46934800)
    • (2007) Applied Physics Letters , vol.90 , Issue.24 , pp. 242906
    • Kim, K.M.1    Choi, B.J.2    Hwang, C.S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.