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Volumn 97, Issue 6, 2010, Pages

Scanning probe based observation of bipolar resistive switching NiO films

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DRIFT; ELECTROCHEMICAL REDOX; FILM INTERFACES; HIGH VACUUM; LOCAL PROBES; METAL-INSULATOR-METAL STRUCTURES; NIO FILMS; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; SCANNING PROBES; SWITCHING MECHANISM; UNIPOLAR SWITCHING;

EID: 77955744489     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3479526     Document Type: Article
Times cited : (31)

References (13)
  • 2
    • 34250327548 scopus 로고    scopus 로고
    • Coexistence of bipolar and unipolar resistive switching behaviors in a Pt TiO2 Pt stack
    • DOI 10.1149/1.2742989
    • D. S. Jeong, H. Schroeder, and R. Waser, Electrochem. Solid-State Lett. ESLEF6 1099-0062 10, G51 (2007). 10.1149/1.2742989 (Pubitemid 46920043)
    • (2007) Electrochemical and Solid-State Letters , vol.10 , Issue.8
    • Jeong, D.S.1    Schroeder, H.2    Waser, R.3
  • 4
  • 9
    • 36048964246 scopus 로고    scopus 로고
    • Anode-interface localized filamentary mechanism in resistive switching of Ti O2 thin films
    • DOI 10.1063/1.2749846
    • K. M. Kim, B. J. Choi, Y. C. Shin, S. Choi, and C. S. Hwang, Appl. Phys. Lett. APPLAB 0003-6951 91, 012907 (2007). 10.1063/1.2749846 (Pubitemid 350092117)
    • (2007) Applied Physics Letters , vol.91 , Issue.1 , pp. 012907
    • Kim, K.M.1    Choi, B.J.2    Shin, Y.C.3    Choi, S.4    Hwang, C.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.