Atomic force microscopy study of laser induced phase transitions in Ge2Sb2Te5

Journal of Applied Physics

Volumn 86, Issue 10, 1999, Pages 5879-5887

  Weidenhof, V ^c   Friedrich, I ^c   Ziegler, S ^a   Wuttig, M ^a,b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000233744     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371606     Document Type: Article

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