Fluidic applications for atomic force microscopy (AFM) with microcantilever sensors

Experiments in Fluids

Volumn 48, Issue 5, 2010, Pages 721-736

  Kim, Seonghwan ^a   Kihm, Kenneth D ^b   Thundat, Thomas ^a,c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

^c UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ELECTRICAL MEASUREMENT TECHNIQUES; FLUID DENSITIES; INTERMOLECULAR FORCES; MEASUREMENT TECHNIQUES; MECHANICAL TRANSDUCERS; MICRO CANTILEVER SENSORS; MICRO-CANTILEVERS; MICRO-SCALES; NANOMECHANICAL CHARACTERIZATION; NANOSCALE FLUIDICS; NANOSCALE TOPOGRAPHY; SENSING APPLICATIONS;

CHEMICAL BONDS; COMPOSITE MICROMECHANICS; ELECTRIC PROPERTIES; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SENSORS; TRANSPORT PROPERTIES;

ATOMIC FORCE MICROSCOPY;

EID: 77952011636     PISSN: 07234864     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00348-010-0830-3     Document Type: Article

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