Nanoscale velocity-drag force relationship in thin liquid layers measured by atomic force microscopy

Applied Physics Letters

Volumn 85, Issue 17, 2004, Pages 3881-3883

  Mechler, Adam ^a,c   Piorek, Brian ^a   Lal, Ratnesh ^b   Banerjee, Sanjoy ^a  

^a University of California   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF SZEGED   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

DRAG COEFFICIENTS; LIQUID SURFACE; SENSOR SIGNALS; THIN LIQUID LAYERS; VELOCITY DRAG;

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; DATA ACQUISITION; DRAG; HYDROPHOBICITY; NANOSTRUCTURED MATERIALS; SURFACE PROPERTIES; TORSIONAL STRESS; VELOCITY MEASUREMENT;

VISCOSITY OF LIQUIDS;

EID: 9744235108     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1808504     Document Type: Article

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